Charge collection characterisation with the Transient Current Technique of the ams H35DEMO CMOS detector after proton irradiatio

Authors: 
Ettore Zaffaroni
John Anders, Mathieu Benoit, Saverio Braccini, Raimon Casanova, Hucheng Chen, Kai Chen, Francesco Armando di Bello, Armin Fehr, Didier Ferrere, Dean Forshaw, Tobias Golling, Sergio Gonzalez-Sevilla, Giuseppe Iacobucci, Moritz Kiehn, Francesco Lanni, Hongb
Published In: 
Journal of Instrumentation

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